Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1997-09-08
1999-03-09
Kim, Robert
Optics: measuring and testing
By polarized light examination
With birefringent element
356358, G01B 902
Patent
active
058808418
ABSTRACT:
A method for determining a range dimension of an object utilizing multiple wavelength interferometry to form an image of the object includes developing a discernible two-dimensional image from an interference pattern at selected points for each of a number of wavelengths, collecting complex values from the interference pattern and developing a phase value from the complex value, and determining a phase correction vector based on a difference between measured phase values and an ideal phase value associated with one or more reference points. The phase correction vector is used to correct each of the selected points. A one-dimensional Fourier transform is performed on the corrected values to yield a range profile for each selected point. A peak value is then determined from the range profile to determine the range dimension. The peak value may be determined based on a simple maximum, oversampling in selected areas prior to performing the Fourier transform, or using curve-fitting techniques. The phase correction vector minimizes phase errors due to various causes such as insufficient knowledge of the laser frequencies, or which occur when optical path lengths of the object and reference beams are not matched, to provide a computationally efficient method of improving accuracy in the range dimension.
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"Three-dimensional lensless imaging using laser frequency diversity", Applied Optics, Jan. 10, 1992, vol. 31, No. 2.
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"Three-dimensional, fine-resolution imaging using laser frequency diversity", Optical Society of America, J. Marron & T. Schulz, .COPYRGT. 1992.
Gleichman Kurt W.
Marron Joseph C.
ERIM International, Inc.
Kim Robert
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