Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-10-10
2006-10-10
Chawan, Sheela (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S255000, C382S266000, C250S559360, C356S511000, C356S609000, C356S614000, C702S155000, C702S167000
Reexamination Certificate
active
07120286
ABSTRACT:
A method and apparatus for tracing an edge contour of an object in three dimensional space is provided. The method and apparatus is utilized in a computer vision system that is designed to obtain precise dimensional measurements of a scanned object. In order to save focusing time during an automatic tracing measurement, multiple images may be collected and saved for a number of Z heights for a particular position of the XY stage. These saved images can later be used to calculate a focal position for each edge point trial location in the selected XY area rather than requiring a physical Z stage movement. In addition, a Z height extrapolation based on the Z heights of previous edge points can significantly speed up the searching process, particularly for objects where the Z height change of a contour is gradual and predictable.
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Description of Prior Art Quick Vision™ Series of Vision Inspection Machines and QVPAK™ Software.
Wasserman Richard M.
Yu Dahai
Chawan Sheela
Christensen O'Connor Johnson & Kindness PLLC
Mitutoyo Corporation
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