Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-12-15
2011-11-08
Lu, Tom Y (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C374S005000, C374S007000, C374S025000, C374S102000, C250S316100, C250S338100, C250S339110, C250S341100, C250S341600, C250S341700, C250S341800, C250S363010, C250S363020, C702S134000, C702S135000, C702S136000
Reexamination Certificate
active
08055054
ABSTRACT:
A non-destructive evaluation system and method is provided for detecting flaws in an object. The system includes a lamp for impinging the object with optical pulses and a focal plane array camera configured to capture the images corresponding to evolution of heat due to an impact of the optical pulses in the object. The system also includes an image acquisition system for capturing data corresponding to the images from the focal plane array camera. Both transmission mode imaging and reflection mode imaging techniques are used in an exemplary embodiment. A time of flight analysis system is also provided for analyzing the data from both transmission mode imaging technique and reflection mode imaging technique. The data from transmission mode imaging is used to determine thickness values at different points in the data and for determining location of flaws using the thickness values. The data from reflection mode imaging is used for determining depth of these flaws.
REFERENCES:
patent: 5179677 (1993-01-01), Anderson et al.
patent: 5711603 (1998-01-01), Ringermacher et al.
patent: 6394646 (2002-05-01), Ringermacher et al.
patent: 2002/0126730 (2002-09-01), Sun et al.
patent: 2002/0128797 (2002-09-01), Sun
patent: 2005/0207468 (2005-09-01), McCullough et al.
patent: 0089760 (1983-09-01), None
Daniels (“Preliminary design of the portable thermal nondestructive evaluation system”, PSR Report 2708, 1997, pp. 1-19).
Santulli (“Impact damage characterisation of thermoplastic matrix composites using transmission transient thermography”, Nondestructive Testing and Evaluation, vol. 19, Issue 3, 2003, pp. 79-90).
Maldague et al. (“A study of defect depth using neural networks in pulsed phase thermography: modeling, noise, experiments”, Rev. Gen. Therm., 1998, vol. 37, pp. 704-717).
Howard Donald Robert
Knight Bryon Edward
Ringermacher Harry Israel
Conway Thomas
Fletcher Yoder P.C.
General Electric Company
Lu Tom Y
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