Method and apparatus for thermal protection in an integrated...

Details Method and apparatus for thermal protection in an integrated... Method and apparatus for thermal protection in an integrated...

2007-05-16

2009-11-24

Allen, Andre J (Department: 2855)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C374S178000

Reexamination Certificate

active

07621671

ABSTRACT:
Some embodiments discussed relate to an apparatus comprising a temperature sensor disposed in an integrated circuit, the temperature sensor including a bipolar transistor having a collector coupled to a portion of a substrate of the integrated circuit, and a bandgap reference circuit configured to generate a reference voltage, and a comparator coupled to the temperature sensor and the bandgap reference circuit, the comparator configured to receive a first voltage from the emitter of the bipolar transistor and the reference voltage from the bandgap reference circuit and generate a switch-off signal based on a voltage difference between the first voltage and the reference voltage.

REFERENCES:
patent: 5357089 (1994-10-01), Prentice
patent: 5886515 (1999-03-01), Kelly
patent: 6002244 (1999-12-01), Wrathall
patent: 6128172 (2000-10-01), Feldtkeller
patent: 6921199 (2005-07-01), Aota et al.
patent: 7033072 (2006-04-01), Aota et al.
patent: 2004/0004992 (2004-01-01), Aota et al.

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