Method and apparatus for the optical electronic measurement of a

Details Method and apparatus for the optical electronic measurement of a Method and apparatus for the optical electronic measurement of a

1988-06-27

1989-08-08

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356387, G01B 902

Patent

active

048547077

ABSTRACT:
An optical electronic method for the measuring of a workpiece is disclosed. A beam of radiation is used to illuminate an edge of the object to be measured to form an actual diffraction pattern. The actual diffraction pattern is converted to electronic signals by means of a sensor and correlated electronically with a predetermined theoretically calculated diffraction pattern.

REFERENCES:
patent: 3812376 (1974-05-01), Takeyama et al.
patent: 3937580 (1976-02-01), Kasuan
patent: 3941484 (1976-03-01), Dreyfus
patent: 4131365 (1978-12-01), Pryor
M. Born, E. Wolf, Principles of Optics, Pergamon Press, Oxford, 1975, pp. 428-430 and 432-435.

Affiliated with

Also associated with

Rating

Method and apparatus for the optical electronic measurement of a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for the optical electronic measurement of a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for the optical electronic measurement of a will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-901428