Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1989-02-15
1990-11-27
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356446, G01B 1130, G01N 2147
Patent
active
049731645
ABSTRACT:
A method and also an apparatus is described for the direct optical detection of the roughness profile of the material surface (10) in which a light bead (14) is generated on the material surface (10) and the reflected light is passed to a light receiver arrangement (16). The angle of reflection of the reflected light and thus the respective surface inclination value is determined for each scanned point of the material surface (10). To determine the angle of reflection the direction of the center of gravity of the scattered reflected light is formed in each case. The desired roughness profile is subsequently reconstructed from the inclination values that are obtained.
REFERENCES:
patent: 4583861 (1986-04-01), Yamaji et al.
patent: 4732485 (1988-03-01), Morita et al.
patent: 4733064 (1988-03-01), Ishikawa
Pettinger Herbert
Pietzsch Karl
Weber Klaus
Erwin Sick GmbH - Optik-Elektronik
Pham Hoa
Rosenberger Richard A.
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