Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1986-01-23
1987-08-11
Willis, Davis L.
Optics: measuring and testing
By polarized light examination
With birefringent element
G01B 902
Patent
active
046858032
ABSTRACT:
An optical apparatus capable of measuring the absolute refractive index of a gas is provided which comprises: (1) an evacuated cell (50) comprised, most preferably, of a bellows (52) with transparent plano windows (41, 61) which have diameters larger than the outside diameter of said bellows (52) attached to each end of said bellows (52); (2) means, most preferably, high reflectivity mirror coating spots (46, 47, 66, 67), for obtaining reflections from the surfaces on the vacuum sides of said windows (41, 61); (3) means for varying the distances between said high reflectivity mirror coatings from less than a few micrometers to approximately 100 millimeters; (4) means, most preferably a first differential plane mirror interferometer (23) with its measurement leg in the gas to be measured outside of the vacuum cell (50); means, most preferably a second differential plane mirror interferometer (33) with its measurement leg in the vacuum cell (50); (6) means, for measuring the first phase variation (73, 75, 77) in said first differential plane mirror interferometer (23) as said distance varies from zero to approximately 100 milimeters; (7) means, for measuring the second phase variation (83, 85, 87) in said second differential plane mirror interferometer (33) as said distance varies from zero to approximately 100 millimeters; (8) means, most preferably a microcomputer (90) for taking the ratio of said first and second phase variations to provide an output (92) which is the absolute index of refraction of the gas.
Koren Matthew W.
Willis Davis L.
Zygo Corporation
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