Method and apparatus for the measurement of the location or move

Details Method and apparatus for the measurement of the location or move Method and apparatus for the measurement of the location or move

1985-04-09

1987-08-11

Rosenberger, R. A.

Optics: measuring and testing

By polarized light examination

With light attenuation

G01B 1100

Patent

active

046858040

ABSTRACT:
A method is disclosed for measuring the rate and/or extent of movement of oscillatory element positioned on an oscillating system by passing a reference beam towards a reference detector over a reference edge. The reference edge is fixed relative to the element. The measurement beam is directed towards the measurement detector over a measurement edge of a surface adapted to move together with the element relative to the reference edge. The movement of the measurement edge cuts the measurement beam as it moves into the path of the measurement beam. The rate and/or extent of movement of the element relative to the reference edge is determined by comparing the illumination received by each of the detectors. Apparatus is also disclosed for measuring the rate and/or extent of movement of an oscillatory element positioned on an oscillating system including a measurement edge adapted to move together with the element. A reference edge is maintained stationary relative to the measurement edge. A device is provided for generating measurement and reference beams directed towards each of the measurement and reference edges whereby at least the measurement beam is cut by the measurement edge upon movement of the measurement edge relative to the reference edge. Detectors are provided which are adapted to measure the amount of illumination cut by the measurement and reference edges and to generate a corresponding signal.

REFERENCES:
patent: 2784588 (1957-03-01), Humble et al.
patent: 3423592 (1969-01-01), Selgin
patent: 3900738 (1975-08-01), McKay
patent: 3945730 (1976-03-01), Simecek et al.
patent: 4021119 (1977-05-01), Stauffer

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