Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-04-18
1995-05-09
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356237, 356445, 356371, G01B 1124
Patent
active
054145180
ABSTRACT:
A transportable apparatus for evaluating a reflective object comprises a main body portion and a plurality of elongated light sources attached to the main body portion. The elongated light sources are adapted to produce images in the reflective object which will visually reveal flaws in the surface of the reflective object through portions of discontinuous curvature. The apparatus can be easily transported to various positions about the reflective object, thereby facilitating evaluation of a variety of differently oriented portions of the object.
REFERENCES:
patent: 3643085 (1972-02-01), Duran
patent: 3666360 (1972-05-01), Mills et al.
patent: 4533245 (1985-08-01), Love, III
patent: 4629319 (1986-12-01), Clarke et al.
patent: 4660561 (1987-04-01), Nielsen
patent: 4792232 (1988-12-01), Tobe et al.
patent: 4918321 (1990-04-01), Klenk et al.
patent: 4929846 (1990-05-01), Mansour
patent: 5001614 (1991-03-01), Buss
patent: 5060118 (1991-10-01), Penrod et al.
patent: 5142648 (1992-08-01), Fitts et al.
patent: 5237404 (1993-08-01), Tanaka et al.
Calcaterra Mark P.
Chrysler Corporation
Pham Hoa Q.
LandOfFree
Method and apparatus for the evaluation of reflective surfaces does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for the evaluation of reflective surfaces, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for the evaluation of reflective surfaces will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1710003