Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1997-02-24
1999-04-13
Shah, Kamini
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
341122, 341123, H03M 700
Patent
active
058938990
ABSTRACT:
A method and apparatus for sampling an analog signal permits the identification of those samples in which data was lost in the sampling process. A data reference element is generated for each sample element, the data reference element having a corresponding sample element. A user friendly display technique is provided to permit the user to controllably display the sampled signal, clearly showing those portions of the signal in which information was lost contrasted with those portions of the signal that were sampled intact.
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Flores David
Johnson William J.
Lachman Larry M.
Vegatoro Guillermo
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