Method and apparatus for the determination of the thickness of t

Details Method and apparatus for the determination of the thickness of t Method and apparatus for the determination of the thickness of t

1986-03-06

1987-10-27

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250228, G01J 100

Patent

active

047031875

ABSTRACT:
The invention relates to a method and apparatus for the determination of the thickness of transparent, clear or colored, layers of lacquer on bright rolled, metallic foil or thin strip, in particular of aluminium or aluminium alloys, wherein the optical transmission factor (D) of the layer is determined. The attenuation of irradiated light reflected from the metallic surface disposed in an arched configuration is measured in the infrared to visible range after transmission through the layers of lacquer.

REFERENCES:
patent: 2821103 (1958-01-01), Blet
patent: 3589817 (1971-06-01), Sugaya
patent: 4150898 (1979-04-01), Suga
patent: 4473848 (1984-09-01), Juergensen

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