Plastic and nonmetallic article shaping or treating: processes – Direct application of electrical or wave energy to work – Measuring – testing – or inspecting
Patent
1994-06-15
1996-05-21
Vargot, Mathieu D.
Plastic and nonmetallic article shaping or treating: processes
Direct application of electrical or wave energy to work
Measuring, testing, or inspecting
264473, 264488, 26417115, 26417117, 26417312, 26417411, 425114, 425141, 378 54, B29C 4706, B29C 4792
Patent
active
055186815
ABSTRACT:
A method and an apparatus for measuring an electric insulated conductor, in particular a medium-voltage and/or high-voltage insulated conductor, are proposed. Seen in profile cross-section, the insulated conductor (50) comprises a copper conductor, an inner semiconductor, an insulation and an outer semiconductor and is produced in an extrusion device (90) having an appropriately assigned crosslinking section (40). To achieve an even distribution of the two semiconductor layers and of the insulation layer, the insulated conductor (50) is radiated through immediately at the outlet from the crosslinking section (40) and a correction of the die setting in the extrusion device is carried out using the values thus determined.
REFERENCES:
patent: 3187071 (1965-06-01), Radziejowski
patent: 3479446 (1969-11-01), Arnaudin, Jr. et al.
patent: 3502752 (1970-03-01), Brown
patent: 3609368 (1971-09-01), Knorr et al.
patent: 3796874 (1974-03-01), Roller et al.
patent: 4137028 (1979-01-01), Reitemeyer et al.
patent: 4259281 (1981-03-01), Lanfranconi et al.
patent: 4585407 (1986-04-01), Silver et al.
patent: 4605525 (1986-08-01), Baxter
patent: 4708837 (1987-11-01), Baxter et al.
patent: 4710114 (1987-12-01), Garner
patent: 4719061 (1988-01-01), Duffy
patent: 4732722 (1988-03-01), Aida et al.
patent: 4997995 (1991-03-01), Simmons et al.
patent: 5138644 (1992-08-01), McArdle et al.
Jung Ulrich
Kotter Wilfried
Salzmann Hannes
Vargot Mathieu D.
Zumbach Electronics AG
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