Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-02-15
2005-02-15
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S057000, C702S070000, C702S076000, C702S126000, C385S002000, C385S005000, C375S242000, C359S237000, C356S005080, C356S005110
Reexamination Certificate
active
06856927
ABSTRACT:
A method and apparatus for the characterization of optical pulses and modulators includes modulating, using a modulator, a train of optical pulses, measuring a spectrum of the modulated train of optical pulses, recording the measured spectrum as an entry in a spectrogram at a position in the spectrogram corresponding to a relative delay between the modulation and the train of optical pulses, incrementing the relative delay, and repeating the above steps until the accumulated relative delay is equal to the period of the spectrogram. The train of optical pulses and the modulator are then characterized using the measured spectra recorded in the spectrogram.
REFERENCES:
patent: 5530544 (1996-06-01), Trebino et al.
patent: 5754292 (1998-05-01), Kane et al.
patent: 6008899 (1999-12-01), Trebino et al.
patent: 6160626 (2000-12-01), Debeau et al.
patent: 6485413 (2002-11-01), Boppart et al.
Dorrer et al.,‘Characterization of the spectral phase of ultrashort light pulses’, Sep. 2001, UOR, pp. 1415-1426.*
Siders et al.,‘Multipulse Interferometric Frequency-Resolved Optical Gating’, Apr. 1999, IEEE, vol.:35, No. 4, pp. 432-440.*
“Characterization of the Electric Field of Ultrashort Optical Pulses,” I. A. Walmsley and V. Wong, vol. 13, No. 11, Nov. 1996, J. Opt. Soc. Am. B, pp. 24532463.
“Measuring Ultrashort Laser Pulses in the Time-Frequency Domain Using Frequency-Resolved Optical Gating,” R. Trebino et al., Rev. Sci. Instrum. 68(9), Sept. 1997, pp. 3277-3295.
“Real-Time Measurement of Ultrashort Laser Pulses Using Principle Component Generalized Projections,” D. J. Kane, IEEE J. of Selected Topics of Quantum Electronics, vol. 4, No. 2, Mar./Apr. 1998, pp. 278-284.
“Recent Progress Toward Real-Time Measurement of Ultrashort Laser Pulses,” D. J. Kane, IEEE Journal of Quantum Electronics, vol. 35, No, 4, Apr. 1999, pp. 421-431.
Dorrer Christophe Jean
Kang Inuk
Desta Elias
Hoff Marc S.
Lucent Technologies - Inc.
LandOfFree
Method and apparatus for the characterization of optical... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for the characterization of optical..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for the characterization of optical... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3506596