Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1998-04-06
2000-01-04
Pham, Hoa Q.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
356430, G01N 2100
Patent
active
06011620&
ABSTRACT:
Inspection apparatus for determining defects in a planar light transmissive object. A diffuse light is projected through a mask toward an object under test at an inspection location. A digital video camera observes the inspection location and obtains images of the object. These images are examined and processed by a signal processor to obtain indications of various defects. The mask utilized is of a selected design having either multiple alternating narrow clear and opaque stripes, or a single narrow clear stripe straddled by opaque regions or a single narrow opaque stripe straddled by clear regions.
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Nelms Anthony Scott
Sites Peter Winston
Northrop Grumman Corporation
Pham Hoa Q.
Sutcliff Walter G.
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