Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-05-17
2008-08-26
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S719000, C324S230000, C360S324200, C338S03200R
Reexamination Certificate
active
07417442
ABSTRACT:
A method for testing a TMR element includes a step of measuring a plurality of resistances of the TMR element by feeding a plurality of sense currents with different current values each other through the TMR element, a step of calculating a ratio of change in resistance from the measured plurality of resistances of the TMR element, and a step of evaluating the TMR element using the calculated ratio of change in resistance.
REFERENCES:
patent: 3256483 (1966-06-01), Broadbent
patent: 6067200 (2000-05-01), Ohba et al.
patent: 6473257 (2002-10-01), Shimazawa et al.
patent: 6927569 (2005-08-01), Worledge et al.
patent: 2002/0154540 (2002-10-01), Sekiguchi et al.
patent: 2004-062954 (2004-02-01), None
Hachisuka Nozomu
Inage Kenji
Shimizu Tatsushi
Takahashi Norio
Wong Pak Kin
Frommer Lawrence & Haug
Nguyen Vincent Q
SAE Magnetics (H.K. ) Ltd.
TDK Corporation
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