Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-03-13
2008-05-13
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S719000, C324S230000, C438S014000, C438S018000
Reexamination Certificate
active
07372282
ABSTRACT:
A method for testing a TMR element includes a step of measuring a plurality of resistances of the TMR element by applying a plurality of voltages with different voltage values each other to the TMR element, respectively, a step of calculating a ratio of change in resistance from the measured plurality of resistances of the TMR element, and a step of evaluating the TMR element using the calculated ratio of change in resistance.
REFERENCES:
patent: 3256483 (1966-06-01), Broadbent
patent: 6067200 (2000-05-01), Ohba et al.
patent: 6473257 (2002-10-01), Shimazawa et al.
patent: 6927569 (2005-08-01), Worledge et al.
patent: 2002/0154540 (2002-10-01), Sekiguchi et al.
Hachisuka Nozomu
Inage Kenji
Kagami Takeo
Kiyono Hiroshi
Takahashi Norio
Nguyen Vincent Q.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
TDK Corporation
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