Method and apparatus for testing the data output system of a mem

Details Method and apparatus for testing the data output system of a mem Method and apparatus for testing the data output system of a mem

1996-09-30

1998-10-20

Beausoliel, Jr., Robert W.

Excavating

371 212, F06F 11227

Patent

active

058260064

ABSTRACT:
A method and apparatus for testing or verifying proper operation of a data output system of a memory system are provided. A known data signal is applied to a bit line, independent of the memory cells of the memory system associated with the bit line. Expected outputs of the data output system are determined based upon the formation or configuration of the data output system and the known data signal. Following application of the known data signal to the bit line, actual outputs of the data output system are compared to the expected outputs to verify proper operation of the data output system.

REFERENCES:
patent: 4430712 (1984-02-01), Coulson et al.
patent: 4435775 (1984-03-01), Brantingham et al.
patent: 4694433 (1987-09-01), Wiedman
patent: 4775942 (1988-10-01), Ferreri et al.
patent: 4969148 (1990-11-01), Nadeau-Dostie et al.
patent: 5040150 (1991-08-01), Naitoh et al.
patent: 5060230 (1991-10-01), Arimoto et al.
patent: 5121355 (1992-06-01), Gubbels et al.
patent: 5231637 (1993-07-01), Tanagawa
patent: 5278956 (1994-01-01), Thomsen et al.
patent: 5315553 (1994-05-01), Morris
patent: 5341382 (1994-08-01), Levitt
patent: 5343406 (1994-08-01), Freeman et al.
patent: 5400342 (1995-03-01), Matsumura et al.
patent: 5428575 (1995-06-01), Fudeyasu
patent: 5436910 (1995-07-01), Takeshima et al.
patent: 5459733 (1995-10-01), Alapat

Affiliated with

Also associated with

Rating

Method and apparatus for testing the data output system of a mem does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing the data output system of a mem, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing the data output system of a mem will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-255720