Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1993-09-15
1995-06-27
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324769, 324537, G01R 104
Patent
active
054283000
ABSTRACT:
A method and apparatus for testing TFT-LCD's turns on a TFT in an active color LCD using TFT's, charges a cell capacitor connected to the LCD through the data line, keeps the capacitor charged after turning off the TFT, discharges the capacitor through a resistor connected to the grounding side through the source and drain of the TFT, and checks the function of the TFT-LCD and the connection of the elements contained therein based on the waveform of a current or discharge induced by the discharge.
REFERENCES:
patent: 5057780 (1991-10-01), Akama et al.
patent: 5179345 (1993-01-01), Jenkins et al.
patent: 5266901 (1993-11-01), Woo
Oshimi Tadashi
Takahashi Isamu
Bowser Barry C.
Telenix Co., Ltd.
Wieder Kenneth A.
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