Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – With auxiliary means to condition stimulus/response signals
Patent
1994-12-22
1996-09-24
Karlsen, Ernest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
With auxiliary means to condition stimulus/response signals
3241581, 324620, G01R 2702, G01R 2320
Patent
active
055594409
ABSTRACT:
A line interface circuit (12.sub.1) having a digital interface (18) and an analog interface (20) coupled to the digital interface by a transmission path (23, 26) may be tested by launching a digital value into the digital interface while the analog interface is terminated by termination impedance (35). The digital value launched into the line interface circuit is converted to an analog signal within the circuit which appears across the termination impedance, creating a voltage that is sensed back on the transmission path. This sensed voltage is convened within line interface circuit back to a digital value for output at the digital interface in response to the originally launched digital test value. The digital value generated at the digital interface of the line interface circuit in response to the test value is stored and processed by comparing the response to a reference value representing the proper operation of the line interface circuit, as derived by modeling the circuit and determining its response to conventional analog testing.
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patent: 5414365 (1995-05-01), Coggins et al.
S. C. Pinault and P. V. Lopresti, "Digital Characterization Techniques for the Analog Performance of Mixed-Signal Devices," IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol. 40, No. 8, Aug. 1993, pp. 480-492.
E. Teraoka et al., "A Built-In Self-Test for ADC and DAC in a Single-Chip Speech CODEC", International Test Conference, Oct. 21, 1993, pp. 1-18.
Lopresti Philip V.
Pinault Steven C.
Karlsen Ernest F.
Levy Robert B.
Lucent Technologies - Inc.
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