Method and apparatus for testing semiconductor integrated circui

Details Method and apparatus for testing semiconductor integrated circui Method and apparatus for testing semiconductor integrated circui

1996-08-06

1998-06-02

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3126

Patent

active

057605998

ABSTRACT:
A current detecting resistance is inserted somewhere in a path for feeding a power source current to a supply voltage terminal VDD of a DUT from a power source of a testing apparatus, and from the potential difference at both ends, a pulse form change due to the state transition of a CMOS circuit in the DUT contained in the power source current is detected. The number of pulse form changes is counted by a counter. In the DUT, a test pattern is applied from a driver, an expected value preset according to the test pattern and the count of the counter are compared, and it is judged whether or not the DUT is in good quality. The current due to a pulse form transition to be detected by the current detecting resistance is larger than the current flowing when the CMOS circuit in the DUT is in a static state, and therefore, the resistance value of the current detecting resistance may be set smaller, so that the time required for testing may be shortened.

REFERENCES:
patent: 4100532 (1978-07-01), Farnbach
patent: 4131848 (1978-12-01), Battle
patent: 4468614 (1984-08-01), Takahashi et al.
patent: 4648104 (1987-03-01), Yachida et al.
patent: 4710704 (1987-12-01), Ando
patent: 4953095 (1990-08-01), Ishikawa et al.
patent: 5057774 (1991-10-01), Verhelst et al.
patent: 5321354 (1994-06-01), Ooshima et al.
patent: 5521524 (1996-05-01), Houston

Affiliated with

Also associated with

Rating

Method and apparatus for testing semiconductor integrated circui does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing semiconductor integrated circui, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing semiconductor integrated circui will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1464523