Method and apparatus for testing quiescent current in integrated

Details Method and apparatus for testing quiescent current in integrated Method and apparatus for testing quiescent current in integrated

1996-02-12

1998-06-02

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3126

Patent

active

057605980

ABSTRACT:
A method and apparatus for obtaining near 100 percent quiescent current test coverage within a reasonable amount of time is accomplished by providing a plurality of test circuits interdisposed between a plurality of combinational logic circuits. During testing, the testing circuits isolate the input of one combinational logic circuit from the output of the preceding combinational logic, thus allowing the test circuit to stimulate the input of the combinational logic circuit. By performing the input stimulations of the plurality of combinational logic circuits simultaneously, only two test steps are needed to check the quiescent current of the plurality of combinational logic circuits.

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