Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2005-04-26
2005-04-26
Wamsley, Patrick (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S118000, C375S376000
Reexamination Certificate
active
06885324
ABSTRACT:
A method of testing or calibrating analog to digital converters in a digital test environment comprising: providing a phase lock loop having a voltage controlled oscillator, and calibrating the phase lock loop in terms of the relation between the input voltage to the voltage controlled oscillator and the frequency of the loop; providing in the phase lock loop a digital comparison means providing an output to a charge pumping means which provides a voltage to the input of a voltage controlled oscillator; applying a predetermined code to one input of the digital comparison means and applying the output code of an analog to digital converter to a further input of the digital comparison means, and applying the input voltage to the voltage controlled oscillator to the input of the analog to digital converter; and when equality is established between the digital codes applied to the inputs of the digital comparison means, and the frequency of the phase lock loop is constant, measuring the frequency of the phase lock loop.
REFERENCES:
patent: 4291414 (1981-09-01), Kimura
patent: 5319370 (1994-06-01), Signore et al.
patent: 5578968 (1996-11-01), Mori et al.
patent: 5724105 (1998-03-01), Hatano
patent: 5796358 (1998-08-01), Shih et al.
patent: 5909186 (1999-06-01), Gohringer
patent: 5920214 (1999-07-01), Lee et al.
patent: 6084480 (2000-07-01), Uneme
patent: 6097227 (2000-08-01), Hayashi
patent: 6118344 (2000-09-01), Toshitani et al.
patent: 6140881 (2000-10-01), Kim
patent: 6222421 (2001-04-01), Kiyose
patent: 6289070 (2001-09-01), Krone et al.
patent: 6377646 (2002-04-01), Sha
patent: 6594330 (2003-07-01), Wilson
patent: 20020190765 (2002-12-01), Matsunami et al.
patent: 2 106 732 (1983-04-01), None
Conley & Rose, P.C.
LSI Logic Corporation
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