Static information storage and retrieval – Magnetic bubbles – Guide structure
Patent
1996-06-10
1999-02-02
An, Meng-Ai T.
Static information storage and retrieval
Magnetic bubbles
Guide structure
39575001, 39575006, 365201, G06F 132
Patent
active
058677194
ABSTRACT:
A method and apparatus for allowing the soft defect detection testing (SDDT) of an memory array (106) of a data processor (100) begins by providing a control value to a memory controller (111). The control value determines whether a switching circuit (104) will apply a VDD power supply voltage from a VDD terminal (132) or a Vstby power supply voltage from a Vstby terminal (130) to a selected portion of the memory array (106). When in an SDDT test mode, the selected portion of the memory array (106) is supplied by the Vstby terminal (130). While being supplied by the Vstby terminal (130), the selected portion of the memory array (106) is SDDT tested by coupling a current detection device to the pin (130) and measuring a current I drawn by the selected portion of the memory array (106).
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patent: 5079744 (1992-01-01), Tobita et al.
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patent: 5283905 (1994-02-01), Saadeh et al.
patent: 5594694 (1997-01-01), Roohparvar et al.
patent: 5615159 (1997-03-01), Roohparvar
Cheng Tony Tong-Khay
Dunn John P.
Harris, II Joseph M.
Nash James C.
An Meng-Ai T.
Etienne Ario
Motorola Inc.
Witek Keith E.
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