Method and apparatus for testing of semiconductor devices

Details Method and apparatus for testing of semiconductor devices Method and apparatus for testing of semiconductor devices

1995-10-20

1997-09-16

Voeltz, Emanuel T.

Boots, shoes, and leggings

364488, 364490, 364579, 395919, 395920, 371 226, 371 271, G06F 1100

Patent

active

056687451

ABSTRACT:
A computer-based method is provided for determining whether a semi-conductor device conforms to design requirements. In one embodiment, the method is based on data stored in a design database, and an automatic test equipment ("ATE") datalog. In a further embodiment, the method includes generating a requirements datalog responsive to the design database, generating a standard datalog responsive to the automatic test equipment datalog, and generating a conformance indication responsive to the requirements datalog and the standard datalog.

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patent: 4894829 (1990-01-01), Monie et al.
patent: 5258932 (1993-11-01), Matsuzaki
patent: 5446742 (1995-08-01), Vahabi et al.
patent: 5539652 (1996-07-01), Tegethoff
patent: 5550971 (1996-08-01), Brunner et al.

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