Method and apparatus for testing logic circuitry by applying a l

Details Method and apparatus for testing logic circuitry by applying a l Method and apparatus for testing logic circuitry by applying a l

1990-06-04

1991-12-10

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 151, 371 221, G01R 3128, G06F 1100

Patent

active

050721780

ABSTRACT:
A testing method of a logic circuit which can change test data in a testing apparatus and an apparatus which is used for the testing method are disclosed. The logic circuit testing apparatus having a first storage to store test data including a plurality of test patterns and a second storage to store each of the test patterns in correspondence to a group of tester pins further has a transfer circuit including a data converter to change the test patterns from the first storage and a third storage to store control data to control the data converter. The transfer circuit transfers each of the test patterns from the first storage to the second storage. When the test pattern is transferred by the transfer circuit, the test pattern is changed by the data converter by the control data.

REFERENCES:
patent: 3764995 (1973-10-01), Helf, Jr. et al.
patent: 4500993 (1985-02-01), Jacobson
patent: 4588945 (1986-05-01), Groves et al.
patent: 4849702 (1989-07-01), West et al.
patent: 4853925 (1989-08-01), Azuma et al.
patent: 4961191 (1990-10-01), Nakagawa et al.
International Test Conference 1985 Proceedings, "The Future of Test", Nov. 19, 20, 21, 1985, The IEEE Computer Society, pp. 431-436.

Affiliated with

Also associated with

Rating

Method and apparatus for testing logic circuitry by applying a l does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing logic circuitry by applying a l, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing logic circuitry by applying a l will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1043305