Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-05-31
2009-02-03
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07486102
ABSTRACT:
An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.
REFERENCES:
patent: 5293178 (1994-03-01), Kobayashi
patent: 5546013 (1996-08-01), Ichioka et al.
patent: 6759867 (2004-07-01), Sohn
Eom Soung Yeoul
Kang Dong Woo
Kim Bong Chul
Yang Ki Soub
LG Display Co. Ltd.
McKenna Long & Aldridge LLP
Nguyen Vinh P
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