Method and apparatus for testing liquid crystal display

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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Reexamination Certificate

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07132846

ABSTRACT:
A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.

REFERENCES:
patent: 5233448 (1993-08-01), Wu
patent: 5537054 (1996-07-01), Suzuki et al.
patent: 6327071 (2001-12-01), Kimura
patent: 6545500 (2003-04-01), Field
patent: 6720791 (2004-04-01), Cheng et al.
patent: 6791632 (2004-09-01), Lee et al.

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