Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-11-07
2006-11-07
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07132846
ABSTRACT:
A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.
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Cho Yong Jin
Jeong See Hwa
Kim Jong Dam
Lee Hyun Kyu
Birch & Stewart Kolasch & Birch, LLP
LG.Phillips LCD Co., Ltd.
Patel Paresh
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