Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-10-26
2000-10-24
Karlsen, Ernest
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, G01R 3126
Patent
active
061373052
ABSTRACT:
A method and apparatus are disclosed for testing individual laser chips located on a laser bar containing a plurality of chips. Laser bars are transported widthwise on a moving plastic film sheet, which is passed over an elongated pedestal which is aligned with the film sheet. The pedestal has a width which is less than the length of a laser bar, so that the unsupported portion of the plastic film under the ends of the laser bars may be drawn downward and away from the bar. This provides access to the metalized underside of the bar, which serves as a common N-contact for all of the laser chips on the bar. A probe is placed in contact with the undersurface of the bar, and at least one additional probe is placed in contact with a P-contact on one of the laser devices. A chip activation signal is applied between the two probes, and a sensor detects whether or not the chip being probed emits radiation. Failure to emit radiation or to emit radiation in an expected manner is indicative of a bad chip.
REFERENCES:
patent: 4716124 (1987-12-01), Yerman et al.
patent: 4779047 (1988-10-01), Solstad et al.
patent: 4855672 (1989-08-01), Shreeve
patent: 4956605 (1990-09-01), Bickford et al.
Freund Joseph Michael
Przybylek George John
Romero Dennis Mark
Karlsen Ernest
Lucent Technologies - Inc.
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