Method and apparatus for testing integrated magnetic head assemb

Details Method and apparatus for testing integrated magnetic head assemb Method and apparatus for testing integrated magnetic head assemb

1996-05-30

1998-02-24

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

29593, 324232, 324235, G01R 3312, G11B 5455, G11B 539

Patent

active

057214883

ABSTRACT:
A method and apparatus for testing an integrated magnetic head assembly for normal operation. The head assembly includes an inductive write element and a MR read element. The method includes a step of applying an external alternating magnetic field to a plurality of magnetic head assemblies which are aligned on a head block and are not yet individually separated from the head block, in a direction perpendicular to an ABS of the head block, and also applying high frequency current to the inductive write element so that alternating leakage magnetic field from the inductive write element is applied to the MR read element, and a step of measuring varying resistance characteristics of the MR read element with respect to the variation of the external alternating magnetic field and to the variation of the alternating leakage magnetic field.

REFERENCES:
patent: 3706926 (1972-12-01), Barrager et al.
patent: 3710235 (1973-01-01), Barrager et al.
patent: 5134366 (1992-07-01), Kirk
patent: 5479098 (1995-12-01), Yokoyama et al.
patent: 5589777 (1996-12-01), Davis et al.
Buckthal, W.H.; Read/Write Head Test IBM Technical Disclosure Bulletin, vol. 17, No. 1, p. 39 Jun. 1974.

Affiliated with

Also associated with

Rating

Method and apparatus for testing integrated magnetic head assemb does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing integrated magnetic head assemb, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing integrated magnetic head assemb will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1877053