Method and apparatus for testing integrated electronic device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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250310, 2504922, 324158D, G01R 1702, G01R 1910, G01R 1912, G01R 3126

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active

049806394

ABSTRACT:
A method and apparatus for testing an integrated electronic device wherein the integrated electronic device to be tested is placed on a sample table. A predetermined position of the integrated electronic device is irradiated with the primary charged beam. A substrate current flowing through a substrate of the integrated electronic device is measured upon radiation of the primary charged beam, and then a potential of the predetermined position irradiated with the primary charged beam is nondestructively measured in accordance with secondary electrons emitted from the predetermined position. A function of the integrated electronic device is evaluated in accordance with the substrate current and the predetermined position potential. The function to be evaluated include leakage characteristics and a capacitance.

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