Classifying – separating – and assorting solids – Sorting special items – and certain methods and apparatus for... – Condition responsive means controls separating means
Reissue Patent
2005-11-29
2005-11-29
Walsh, Donald P. (Department: 3653)
Classifying, separating, and assorting solids
Sorting special items, and certain methods and apparatus for...
Condition responsive means controls separating means
C209S911000, C324S1540PB
Reissue Patent
active
RE038894
ABSTRACT:
There is an IC (integrated circuit) testing device11that receives singulated ICs from a singulation station's bottom table44, where an IC15has slid down onto loading ramp or track16. The IC will slide into test station18, where stop pin22has been inserted to stop the IC in DUT (device under test) station20. In the DUT station, the IC is securely held in position by an extractor bar26, insertion bar28, and a part guide24. Thereby, test cite station18will move downward and insert IC15into testing socket30. After testing the IC, testing station18returns upward with IC in the same secured position. Pin22will be removed to allow the IC to slide into part holding station31. If the IC was not defective, pin32will be removed to allow the IC to slide onto track36of the IC separator station34. While the test cite station18is in the up position a second IC is slid along track16and loaded into DUT cite20being readied for the next test cycle. However, if the first IC was found to be defective, pin32will be positioned so as to stop the IC from sliding onto track36. Thereby, the test cite18will proceed to the down position to test the second IC, and simultaneously pin32will be removed to now allow the defective IC to slide onto track38. The second IC has now completed its testing and is ready to proceed to the remainder of the cycle.
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Rodriguez Joseph C
TraskBritt
Walsh Donald P.
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