Method and apparatus for testing imager devices using a...

Details Method and apparatus for testing imager devices using a... Method and apparatus for testing imager devices using a...

2006-07-20

2009-12-15

Stafira, Michael P (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

C356S237200, C356S237500

Reexamination Certificate

active

07633611

ABSTRACT:
An optical test system includes a light source, a first turning optic, and a second turning optic. The second turning optic is positioned proximate the light source and is operable to direct light from the light source to the first turning optic. The first turning optic is further operable to direct light from the second turning optic to illuminate one of a plurality of test regions for receiving devices under test. At least one of the first and second turning optics is movable to align the light generated by the light source with a selected test region.

REFERENCES:
patent: 5034618 (1991-07-01), Akeel et al.
patent: 5504630 (1996-04-01), Hansen
patent: 6335824 (2002-01-01), Overbeck
patent: 6586750 (2003-07-01), Montagu et al.
patent: 7312919 (2007-12-01), Overbeck
patent: 2002/0154396 (2002-10-01), Overbeck

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