Method and apparatus for testing EPROM type semiconductor device

Details Method and apparatus for testing EPROM type semiconductor device Method and apparatus for testing EPROM type semiconductor device

1987-07-15

1989-01-17

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 324158F, 371 21, G01R 104, G01R 3100

Patent

active

047990210

ABSTRACT:
An apparatus and a relative method which permit carrying out a complete cycle of functional tests and parametric measurements on EPROM type semiconductor devices during their permanence inside a burn-in chamber, thus greatly reducing the time necessary for testing and classifying the devices, besides ensuring a higher reliability. The system utilizes special "intelligent" cards, i.e. provided with a card microprocessor which may be connected to a supervisory system's CPU directing the test and classification process of the devices.

REFERENCES:
patent: 4578751 (1986-03-01), Erwin
patent: 4636726 (1987-01-01), Santomango et al.
patent: 4695707 (1987-09-01), Young
patent: 4713611 (1987-12-01), Solstad et al.

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