Method and apparatus for testing EPROM type semiconductor device

Details Method and apparatus for testing EPROM type semiconductor device Method and apparatus for testing EPROM type semiconductor device

1988-10-17

1989-10-03

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158F, 324158R, 371 213, G01R 3100, G01R 3102

Patent

active

048719633

ABSTRACT:
An apparatus and a relative method which permit carrying out a complete cycle of functional tests and parametric measurements on EPROM type semiconductor devices during their permanence inside a burn-in chamber, thus greatly reducing the time necessary for testing and classifying the devices, besides ensuring a higher reliability. The system utilizes special "intelligent" cards, i.e., provided with a card microprocessor which may be connected to a supervisory system's CPU directing the test and classification process of the devices.

REFERENCES:
patent: 3969618 (1976-07-01), Strubel et al.
patent: 4061908 (1977-12-01), de Jonge et al.
patent: 4379259 (1983-04-01), Varodi et al.
patent: 4553225 (1985-11-01), Ohe
patent: 4689791 (1987-08-01), Ciuciu et al.
"Dynamic Burn-In System", by Belyeu et al, IBM Tech. Disc. Bull., vol. 22, #8A, 1/80, pp. 3065-3068.

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