Method and apparatus for testing emissive cathodes

Computer graphics processing and selective visual display system – Plural physical display element control system – Display elements arranged in matrix

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345904, 324754, G09G 322, G01R 3102

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active

057512620

ABSTRACT:
A method of electrically testing pixel functionality is provided comprising releasably disposing a wafer in a socket. The wafer has at least one baseplate comprised of cathode emitters arranged in pixels. The socket has pads. The socket pads are contacted with test pins, and each of the pixels is addressed individually, thereby causing the cathode emitters to emit electrons in a current. The current is collected from each of the pixels on an anode screen. Alternatively, the anode card may have pins, and these pins contact pads on the baseplate. The baseplate, or substrate with baseplates, does not require a socket with pins.

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