Method and apparatus for testing electronics of a storage...

Details Method and apparatus for testing electronics of a storage... Method and apparatus for testing electronics of a storage...

2010-01-11

2011-10-04

Olson, Jason (Department: 2627)

Dynamic magnetic information storage or retrieval

General processing of a digital signal

Data clocking

C360S031000, C360S046000

Reexamination Certificate

active

08031424

ABSTRACT:
A system including a read channel device and a loopback circuit. The read channel device communicates with a hard disk controller module via a read bus and a write bus. The loopback circuit is configured to selectively loop back the write bus to the read bus. The read channel device is configured to generate a write clock for the hard disk controller module to write data on the write bus. The read channel device is configured to generate a read clock for the hard disk controller module to read the data on the read bus. The write clock is independent of the read clock.

REFERENCES:
patent: 5479098 (1995-12-01), Yokoyama et al.
patent: 6397042 (2002-05-01), Prentice et al.
patent: 6657953 (2003-12-01), Hiramoto et al.
patent: 7099278 (2006-08-01), Momtaz
patent: 7439729 (2008-10-01), Azimi et al.
patent: 7477467 (2009-01-01), Sutardja
Communication and extended European Search Report from the European Patent Office dated May 11, 2007 for Application No. 07 000 463.5-1247; 8 pages.
Matthes, Doug et al; “Technique for Testing a Very High Speed Mixed Signal Read Channel Design”; Proceedings International Test Conference; Oct. 30, 2000; pp. 965-970.

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