Method and apparatus for testing electronic devices

Details Method and apparatus for testing electronic devices Method and apparatus for testing electronic devices

2005-02-22

2005-02-22

Cuneo, Kamand (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C324S762010

Reexamination Certificate

active

06859058

ABSTRACT:
Test circuitry and test methods performing supply current measurement is presented. The test circuitry can be but is not limited to be on-chip. The supply current, also denoted test current, can be transient. The test circuitry and methods do not cause additional power supply voltage degradation. The test circuitry and methods provide detection capabilities for open defects, causing significant reduction of the transient supply current.

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