Method and apparatus for testing electronic devices

Details Method and apparatus for testing electronic devices Method and apparatus for testing electronic devices

2005-04-26

2005-04-26

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S763010

Reexamination Certificate

active

06885207

ABSTRACT:
An apparatus including a circuit substrate having a plurality of contactor pins extending between two opposing surfaces; and at least one capacitor mounted on one of the two opposing surfaces of the circuit substrate.

REFERENCES:
patent: 4791391 (1988-12-01), Linnell et al.
patent: 5221209 (1993-06-01), D'Amico
patent: 5290193 (1994-03-01), Goff et al.
patent: 5307012 (1994-04-01), Bhattacharyya et al.
patent: 5309324 (1994-05-01), Herandez et al.
patent: 5672981 (1997-09-01), Fehrman
patent: 5721495 (1998-02-01), Jennion et al.
patent: 5869961 (1999-02-01), Spinner
patent: 5923176 (1999-07-01), Porter et al.
patent: 5933309 (1999-08-01), Smith
patent: 5945837 (1999-08-01), Fredrickson
patent: 6046597 (2000-04-01), Barabi
patent: 6049217 (2000-04-01), Viswanath et al.
patent: 6342788 (2002-01-01), McAllister et al.
patent: 6597190 (2003-07-01), Chan et al.
patent: 3716240 (1987-12-01), None
patent: 0498530 (1992-12-01), None

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