Method and apparatus for testing electronic devices

Details Method and apparatus for testing electronic devices Method and apparatus for testing electronic devices

1979-07-16

1981-12-22

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158R, G01R 3112, H03F 152

Patent

active

043073425

ABSTRACT:
A surge protector is tested by injecting a current spike with an exponentially decaying waveshape (12) through the surge protector. The current is generated by connecting a voltage source (16) to the surge protector and controlling the current through the surge protector by a Darlington array amplifier (20) connected between the surge protector and ground. The Darlington array amplifier (20) is in turn controlled by first generating a reference pulse having a voltage waveform corresponding to the desired current waveform and comparing this reference voltage with a voltage feedback from the Darlington array amplifier (20) to in turn generate an error voltage which is coupled into the amplifier (20). Additionally, differential amplifier circuits (44 and 46) monitor the voltage impressed on the amplifier (20) and reduce the input voltage to the amplifier (20) significantly if the voltage impressed on the amplifier (20) is greater than a predetermined fraction of the voltage source (16).

REFERENCES:
patent: 3054954 (1962-09-01), Boscia et al.
patent: 3371276 (1968-02-01), Schiff
patent: 3978405 (1976-08-01), Petree
patent: 3979672 (1976-09-01), Arnoldi
patent: 3988694 (1976-10-01), Yamazaki
patent: 4075549 (1978-02-01), Woodward
patent: 4091434 (1978-05-01), Suzuki et al.
patent: 4122400 (1978-10-01), Mendendorp et al.
Sarles, Jr. et al.; "Balloon Flight . . . ", Review of Sci. Instruments, vol. 42, No. 3, Mar. 1971, pp. 346-353.

Affiliated with

Also associated with

Rating

Method and apparatus for testing electronic devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing electronic devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing electronic devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2369975