Method and apparatus for testing delta-sigma modulators

Details Method and apparatus for testing delta-sigma modulators Method and apparatus for testing delta-sigma modulators

1990-05-25

1991-11-26

Pellinen, A. D.

Coded data generation or conversion

Converter calibration or testing

341143, H03M 110

Patent

active

050686577

ABSTRACT:
A delta-sigma modulator (14) is readily tested by sampling an input test signal at a first rate and inputting the samples to the delta-sigma modulator under test so that the modulator outputs a digital signal representative of each sample. The input signal is also sampled at a second rate and an error factor is then established in accordance with the difference between the value of the output signal produced by the delta-sigma modulator and the value of the sample obtained by sampling the input signal at the second rate. By comparing the error factor to a prescribed value, the proper operation of the delta-sigma modulator can be verified.

REFERENCES:
patent: 4542354 (1985-09-01), Robinton et al.
patent: 4943807 (1990-07-01), Early et al.
patent: 4951052 (1990-08-01), Jacob et al.
Crystal Semiconductor Corporation Data Book, (Jul. 1989), pp. 15-67 thru 15-71.

Affiliated with

Also associated with

Rating

Method and apparatus for testing delta-sigma modulators does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing delta-sigma modulators, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing delta-sigma modulators will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2388397