Method and apparatus for testing crystal elements

Details Method and apparatus for testing crystal elements Method and apparatus for testing crystal elements

1978-01-19

1979-06-19

Strecker, Gerard R.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

G01R 2922

Patent

active

041588053

ABSTRACT:
A method and apparatus for determining anomalies in the frequency- or admittance-temperature characteristic of a piezoelectric crystal resonator by inserting a variable capacitance network in series with the crystal and electronically sweeping the value of the capacitance network by a control voltage applied thereto while the temperature remains constant and noting any abrupt change in the resonance frequency characteristic.

REFERENCES:
patent: 2733405 (1956-01-01), Gerber
patent: 2919398 (1959-12-01), Guttwein et al.
patent: 2931976 (1960-04-01), Gougoulis
patent: 2976604 (1961-03-01), Kosowsky
patent: 3593125 (1971-07-01), Wilhelm
Critchlow, G. F., Measuring Crystal Inductance at High Frequencies, Bell oratories Record, Apr. 1949, vol. XXVII, No. 4, pp. 138-140.

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