Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-01-24
2010-06-01
Lyons, Michael A (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C359S838000
Reexamination Certificate
active
07728988
ABSTRACT:
According to one aspect, a part has two reflective surfaces, one being a conic surface portion having an axis with a focus thereon, and the other being part of a spherical surface with a centerpoint at the focus. According to a different aspect, a method includes fabricating a part with first and second reflective surfaces, the first being a conic surface portion with an axis and a focus on the axis, and the second being a spherical surface portion with a centerpoint at the focus. The second surface is used to position the part so that the focus coincides with the centerpoint of a spherical wave from an interferometer. Then, a reflective further spherical surface portion on a member is used with the interferometer to position a centerpoint of the further surface at the focus. The interferometer then evaluates the first surface for accuracy.
REFERENCES:
patent: 3784836 (1974-01-01), Tolliver
patent: 4084887 (1978-04-01), Sigler
patent: 5864402 (1999-01-01), Stenton
patent: 6634759 (2003-10-01), Li
patent: 2006/0120429 (2006-06-01), Murakami
Haynes and Boone LLP
Lyons Michael A
Raytheon Company
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