Method and apparatus for testing coins

Check-actuated control mechanisms – Including means to test validity of check – By testing material composition

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G07D 508

Patent

active

053419081

DESCRIPTION:

BRIEF SUMMARY
FIELD OF THE INVENTION

This invention relates to a method and apparatus for testing coins.


BACKGROUND OF THE INVENTION

In this specification, the term "coin" is used to encompass genuine coins, tokens, counterfeit coins and any other objects which may be used in an attempt to operate coin-operated equipment.
Coin testing apparatus is well known in which a coin is subjected to a test by passing it through a passageway in which it enters an oscillating magnetic field produced by an inductor and measuring the degree of interaction between the coin and the field, the resulting measurement being dependent upon one or more characteristics of the coin and being compared with a reference value, or each of a set of reference values, corresponding to the measurement obtained from one or more denominations of acceptable coin. It is most usual to apply more than one such test, the respective tests being responsive to respective different coin characteristics, and to judge the tested coin acceptable only if all the test results are appropriate to a single, acceptable, denomination of coin. An example of such apparatus is described in GB-A-2 093 620.
One particular test which is often applied is to determine the maximum effect that the coin has on the amplitude of a signal derived from the inductor. This may be done simply by measuring the peak value that the amplitude reaches as the coin passes by the inductor, or measuring both that peak amplitude, and also the amplitude when the coin is not adjacent to the inductor and taking a function of (for example, either the difference between, or the ratio of) those two amplitudes so as to obtain a value which is less influenced by drift in the circuitry and variations in component parameters. These tests based on amplitude give an indication of the effective resistance (or loss) that is introduced into the inductor circuit by the coin when the coin is sufficiently close to the inductor that eddy currents are being induced in it.
In EP-B1-0 062 411 there is disclosed a method of testing coins in which, as one feature, the effective resistance or loss of a coil, as influenced by a coin held stationary adjacent the coil, is measured by switching a phase change repeatedly into, and out of, the feed back loop of an oscillating tuned circuit, measuring the oscillation frequency with the phase change in the circuit, and without the phase change in the circuit, and taking the difference between the two measured frequencies as an indication of effective resistance. It is inherent in that method that frequency measurements have to be taken on the same coin, using the same circuit, but at different times. To enable this to be done, EP-B1-0 062 411 proposes that after the arrival of a coin in the testing apparatus has been detected a delay of one third of a second is provided to allow the coin to come to rest in a fixed stable position against a stop in a coin runway, where the coin is located between the two halves of a testing coil. When the coin is in that fixed position, the phase change is repeatedly switched into and out of the oscillator circuit for periods which are at least 3.75 ms long, and this is done many times whilst frequency measurements are taken, the coin then being released by the stop to continue its passage through the testing apparatus.
Although in principle this is a useful way of measuring resistance or loss, in practice the need to hold the coin stationary makes the method and apparatus unsuitable for testing a succession of coins rapidly one after the other, which is a requirement in most practical applications of coin testing apparatus.


SUMMARY OF THE INVENTION

The invention involves the realisation that, contrary to the disclosure in the above prior art, it is possible to perform a similar method of measuring effective resistance or loss while the coin is actually moving past the inductor of a tuned circuit.
More particularly, the invention provides a method of testing coins using an oscillating tuned circuit which includes an inductor, three parameters

REFERENCES:
patent: 4946019 (1990-08-01), Yamashita

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for testing coins does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing coins, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing coins will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-24915

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.