Method and apparatus for testing circuits

Details Method and apparatus for testing circuits Method and apparatus for testing circuits

1975-11-13

1977-01-11

Rolinec, R. V.

Electricity: measuring and testing

Plural, automatically sequential tests

235153AC, G01R 1512

Patent

active

040029743

ABSTRACT:
Functional and parametric checks of a circuit to be tested are in effect conducted concurrently. Equivalent loads are connected to the circuit and the loads are programmable under control of a test system. In that way, various different fan-in and fan-out capabilities as well as other parameters of the circuit may be sequentially checked without disconnecting the system from the circuit and while functional testing is taking place.

REFERENCES:
patent: 3562644 (1971-02-01), DeWolf
patent: 3633016 (1972-01-01), Walker et al.
patent: 3673397 (1972-06-01), Schaefer
patent: 3728616 (1973-04-01), Cheek et al.
patent: 3772595 (1973-11-01), De Wolf et al.
patent: 3826909 (1974-07-01), Ivashin
patent: 3883802 (1975-05-01), Puri
patent: 3916306 (1975-10-01), Patti
Testing Complex Mos: The How and Why, Ron Danklefs and Homer Thornton, The Electronic Engineer, Oct. 1970, vol. 29, No. 10, pp. 42-46.
Automatic IC Dynamic Testers, T. Dreher & D. Johnson, Solid State Technology, vol. 12, No. 3, Mar. 1969, pp. 31-35.

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