Method and apparatus for testing circuit using light emission

Details Method and apparatus for testing circuit using light emission Method and apparatus for testing circuit using light emission

2005-05-17

2005-05-17

Ko, Tony (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

C250S559450, C356S237400

Reexamination Certificate

active

06894301

ABSTRACT:
A method and apparatus for testing a circuit by detecting light emission from the circuit. The circuit tester of the present invention includes a signal source, a photodetector, and a judging unit. The signal source supplies an input signal, which is a test pattern, to a circuit. The photodetector detects emission of hot electrons produced by the input signal supplied to the circuit, and converts it into an electrical signal. The judging unit judges the existence of a defect of the circuit based on a pulse width of the converted electrical signal. Specifically, a pulse width measurement element measures whether the pulse width of the electrical signal exceeds a predetermined pulse width, and a detector detects the existence of a defect of the circuit based on an output of the pulse width measurement element. When the pulse width of the electrical signal is long owing to abnormal current produced in the circuit, the detector judges that the circuit is defective.

REFERENCES:
patent: 5981967 (1999-11-01), Luo
patent: 6650768 (2003-11-01), Evans
patent: 0 937 989 (1999-08-01), None
patent: 2-31175 (1990-02-01), None
patent: 11-16974 (1999-01-01), None
International Preliminary Examination Report dated Jul. 18, 2002, 3 pages.

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