Method and apparatus for testing circuit boards

Details Method and apparatus for testing circuit boards Method and apparatus for testing circuit boards

2007-03-06

2007-03-06

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S084000, C324S095000, C324S501000, C324S758010, C714S738000

Reexamination Certificate

active

10923446

ABSTRACT:
The invention provides a method of apparatus for testing circuit boards which does not require any inner wide power plane so as to detect an open circuit defect and/or a short circuit defect in a conductor path network formed in the circuit board quickly and accurately. An apparatus for testing a circuit board according to the present invention includes a transmission unit (2) for transmitting electromagnetic (radio) wave signal by way of an antenna (1) to a circuit board (3) to be tested, a detecting unit (3) for detecting signal received by a conductor path (4) of the circuit board (3) by using the conductor path (4) as a receiving antenna, and compare unit (8) for determining whether or not there is an open circuit defect or a short circuit defect in the conductor path (4) by comparing the detected signal with reference data of corresponding to a conductor path not including any defect.

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Y. Hidehira, “Bare Board Tester With Moving Probes for BGA/CSP,” electronic material published by Kogyouchosakai, Sep. 1999, vol. 38, No. 9, pp. 77-81.

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