Method and apparatus for testing and evaluating performance...

Radiant energy – Photocells; circuits and apparatus – Temperature control of photocell

Reexamination Certificate

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C250S2140RC, C250S338100, C324S501000, C324S754120

Reexamination Certificate

active

07847237

ABSTRACT:
A method for evaluating performance of a solar cell, comprising: a current passing step (S1) of passing, in a forward direction, a direct current with respect to a solar cell element constituting the solar cell; a temperature control step (S2) of heating the solar cell element and controlling a heating temperature of the solar cell element; and a light emission detecting step (S3) of detecting light emission characteristics of light generated from the solar cell element due to the passing of the direct current in the current passing step and the heating of the solar cell element in the temperature control step (S2).

REFERENCES:
patent: 5334844 (1994-08-01), Pollard et al.
patent: 5834661 (1998-11-01), Nonaka et al.
patent: 6225640 (2001-05-01), Glenn et al.
patent: 2005/0133723 (2005-06-01), Lee et al.
patent: 2005/0252545 (2005-11-01), Nowlan et al.
patent: 2008/0088829 (2008-04-01), Fuyuki
patent: 1416288 (2004-05-01), None
patent: 2006/059615 (2006-06-01), None
Fuyuki, T. et al., “One shot mapping of minority carrierdiffusion length in polycrystalline silicon solar cells using electroluminescence”, Jan. 3-7, 2005, Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE, pp. 1343-1345.
International Search Report for PCT/JP2006/058989, mailed Jun. 5, 2007.
Fuyuki, “Electroluminescence-ho Ni Yoru Kesshokei Silicon Taiyo Denchi no Kino Hyoka”, 2006 Nen Shunki Dai 53 Kai Oyo Butsurigaku Kankei Rengo Koenkai Keon Yokoshu, Separate vol. 0, 2006, p. 100.
T. Fuyuki et al., “Photographic Surveying of Minority Carrier Diffusion” Applied Physics Letters 86, 262108 (2005).
N. Sakitani et al., “Evaluation of Recombination Velocity at Grain Boundaries in Poly-Si Solar Cells with Laser Beam Induced Current” Solid State Phenomena vol. 93 (2003), pp. 351-354.
J. Isenberg et al., “Spatially Resolved IR-Measurement Techniques for Solar Cells” Presented at the 19thEuropean Photovoltaic Solar Energy Conference, Jun. 7-11, 2004, Paris.
E. Rueland et al., “Optical μ-Crack Detection in Combination With Stability Testing for In-Line- Inspection of Wafers and Cells” 20thEuropean Photovoltaic Solar Energy Conference, Jun. 6-10, 2005, Barcelona, Spain.
International Search Report for PCT/JP2007/058989, mailed Jun. 5, 2007. (submitted with IDS Oct. 29, 2008).
Fuyuki, “Electroluminescence-ho Ni Yoru Kesshokei Silicon Taiyo Denchi no Kino Hyoka”, 2006 Nen Shunki Dai 53 Kai Oyo Butsurigaku Kankei Rengo Koenkai Koen Yokoshu, Separate vol. 0, 2006, p. 100. (submitted with IDS Oct. 29, 2008). “Extended Abstracts (The 53rdSpring Meeting, 2006); The Japan Society of Applied Physics and Related Societies” (Partial English translation and discussion of relevance of publication).
Takashi Fuyuki et al., “Quantitative Imaging of Excess Minority Carrier Density” . . . 21 st European Photovoltaic Solar Energy Conference Sep. 4-8, 2006 Dersden, Germany.
Athapol Kitiyanan, et al., “Electroluminescence Analysis of Crystalline . . . ” 2ndInternational Workshop on Science and Technology on Crystalline Si Solar Cells Dec. 9-12, 2007 Xiamen , China.
“Observation of Electroluminescence from Amorphous Silicon Solar Cells at Room Temperature”, Japanese Journal of Applied Physics vol. 21, No. 8, Aug. 1982 pp. L473-L475.
Keda Wang et al.; “Electroluminescence and forward bias current in p-i-n and p-b-i-n a-Si;H solar cells” dated May 1, 1993.
M.A. Ordaz et al.; “Machine vision for solar cell characterization” dated Dec. 31, 2000.
K. Penner, Journal de Physique: “Electroluminescence form Silicon Devices” dated Sep. 1988.

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