Method and apparatus for testing an analog to digital converter

Details Method and apparatus for testing an analog to digital converter Method and apparatus for testing an analog to digital converter

1992-01-31

1993-02-09

Hoff, Marc

Coded data generation or conversion

Converter calibration or testing

324 731, H03M 110

Patent

active

051856077

ABSTRACT:
A method and apparatus for testing an analog to digital converter (14) having a resistor digital to analog converter (32). In one form, the analog to digital converter uses a small amount of resistor test logic (44) to test for defects in the resistor array (42), the switch array (38), and the optional decode logic (36). Instead of performing time-consuming analog to digital conversions, the functionality of the above mentioned circuitry, which includes some analog circuitry, is tested by using a pull-up function and a pull-down function that can be overdriven by properly functioning circuitry. As a result of using resistor test logic (44), a very quick pass/fail functional test using digital logic levels as inputs can be performed on the analog to digital converter (14). The quick functional test does not require analog inputs or time-consuming analog to digital conversions.

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