Method and apparatus for testing a hall magnetic field...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07492178

ABSTRACT:
A method for testing a Hall magnetic field sensor on a wafer includes generating a current flow in a Hall plate of the Hall magnetic field sensor. At least one voltage value across first and second nodes is measured and a measured voltage signal is provided indicative thereof. An electrical resistance based upon the measured voltage and the current is then determined, in the absence of an applied test magnet field.

REFERENCES:
patent: 3487301 (1969-12-01), Gardner et al.
patent: 4857839 (1989-08-01), Look et al.
patent: 5150042 (1992-09-01), Look et al.
patent: 5169485 (1992-12-01), Allen et al.
patent: 5614754 (1997-03-01), Inoue
patent: 6154027 (2000-11-01), Alexander et al.
patent: 6362618 (2002-03-01), Motz
patent: 2002/0028456 (2002-03-01), Mansky et al.
patent: 682017 (1993-06-01), None
patent: 0 631 147 (1994-12-01), None
patent: 860200 (1961-02-01), None
patent: 1144155 (1969-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for testing a hall magnetic field... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing a hall magnetic field..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing a hall magnetic field... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4063043

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.