Optics: measuring and testing – Photometers – Photoelectric
Patent
1993-10-05
1996-08-20
Pham, Hoa Q.
Optics: measuring and testing
Photometers
Photoelectric
359110, 371 51, G01J 142
Patent
active
055483992
ABSTRACT:
A method of testing a DC coupled optical receiver is provided. DC light is superimposed on an optical signal, the power of DC light is changed to observe waveform at a light extinction level, and the measurement and the prediction of the bit error rate are performed. Similarly, in a multi-channel DC coupled optical receiver, DC light is applied to a channel to be observed, while signal light is applied to other channels to observe cross-talk.
REFERENCES:
patent: 5153667 (1992-10-01), Aoshima et al.
"Subsystem Optical Interconnections Using Long-Wavelength Laser Diode and Single-mode Fiber Arrays", by Atsushi Takai, et al., Aug. 5, 1992.
Institute Electronic, Information and Communication Engineers of Japan, Technical Research, Report, OCS92-30.
S. Hanatani et al., "Fully-Integrated Error-Free Optical Subsystem Interconnections", Denshi Tokyo No. 32, (1993) pp. 194-198.
S. Hanatani et al., "Transmission Characteristics of Optical Subsystem Interconnections", Technical Report of IEICE, (1993) pp. 25-32.
A. Takai et al., "200-Mb/s/ch 100-m Optical Subsystem Interconnections Using 8-channel 1.3-m Laser Diode Arrays and Single-Mode Fiber Arrays", Journal of Lightwave Technology, vol. 12, No. 2, Feb. 1994, pp. 260-269.
Hanatani Shoichi
Takai Atsushi
Hitachi , Ltd.
Pham Hoa Q.
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